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Continuity and reliability assessment of a scalable 3×50μm and 2×40μm Via-middle TSV module
Publication:
Continuity and reliability assessment of a scalable 3×50μm and 2×40μm Via-middle TSV module
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Date
2016
Proceedings Paper
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Van Huylenbroeck, Stefaan
;
Li, Yunlong
;
Stucchi, Michele
;
Bogaerts, Lieve
;
De Vos, Joeri
;
Beyer, Gerald
;
Beyne, Eric
;
Brouri, Mohand
;
Nalla, Praveen
;
Gopinath, Sanjay
;
Thorum, Matthew
;
Richardson, Joe
;
Yu, Jengyi
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1948
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Acq. date: 2025-12-09
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Metrics
Views
1948
since deposited on 2021-10-23
1
last month
1
last week
Acq. date: 2025-12-09
Citations