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Electrical-based ESD characterization methodology for ultrathin body SOI MOSFETs
Publication:
Electrical-based ESD characterization methodology for ultrathin body SOI MOSFETs
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Date
2010
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Basic data
APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Griffoni, Alessio
;
Thijs, Steven
;
Russ, Christian
;
Tremouilles, David
;
Linten, Dimitri
;
Scholz, Mirko
;
Simoen, Eddy
;
Claeys, Cor
;
Meneghesso, Gaudenzio
;
Groeseneken, Guido
Journal
IEEE Transactions on Device and Materials Reliability
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1930
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Acq. date: 2025-12-10
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Views
1930
since deposited on 2021-10-18
2
last month
1
last week
Acq. date: 2025-12-10
Citations