Publication:

Electrical-based ESD characterization methodology for ultrathin body SOI MOSFETs

Date

2010
Journal article
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dc.contributor.authorGriffoni, Alessio
dc.contributor.authorThijs, Steven
dc.contributor.authorRuss, Christian
dc.contributor.authorTremouilles, David
dc.contributor.authorLinten, Dimitri
dc.contributor.authorScholz, Mirko
dc.contributor.authorSimoen, Eddy
dc.contributor.authorClaeys, Cor
dc.contributor.authorMeneghesso, Gaudenzio
dc.contributor.authorGroeseneken, Guido
dc.contributor.imecauthorThijs, Steven
dc.contributor.imecauthorLinten, Dimitri
dc.contributor.imecauthorSimoen, Eddy
dc.contributor.imecauthorGroeseneken, Guido
dc.contributor.orcidimecThijs, Steven::0000-0003-2889-8345
dc.contributor.orcidimecLinten, Dimitri::0000-0001-8434-1838
dc.contributor.orcidimecSimoen, Eddy::0000-0002-5218-4046
dc.date.accessioned2021-10-18T16:44:40Z
dc.date.available2021-10-18T16:44:40Z
dc.date.embargo9999-12-31
dc.date.issued2010
dc.identifier.issn1530-4388
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/17191
dc.identifier.urlhttp://ieeexplore.ieee.org/search/srchabstract.jsp?tp=&arnumber=5339158&queryText%3Dgriffoni%26openedRefinements%3D*%26searchFie
dc.source.beginpage130
dc.source.endpage141
dc.source.issue1
dc.source.journalIEEE Transactions on Device and Materials Reliability
dc.source.volume10
dc.title

Electrical-based ESD characterization methodology for ultrathin body SOI MOSFETs

dc.typeJournal article
dspace.entity.typePublication
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