Publication:

Characterization of AlCVD-Al2O3 and ZrO2 layer using X-ray photoelectron spectroscopy

Date

Loading...
Thumbnail Image

Abstract

Description

Statistics

Views

2040 since deposited on 2021-10-14
1last month
Acq. date: 2026-04-05

Citations

Statistics

Views

2040 since deposited on 2021-10-14
1last month
Acq. date: 2026-04-05

Citations