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Impact of tunnel-oxide nitridation on endurance and read-disturb characteristics of flash E2PROM devices
Publication:
Impact of tunnel-oxide nitridation on endurance and read-disturb characteristics of flash E2PROM devices
Date
1997
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Basic data
APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
De Blauwe, Jan
;
Wellekens, Dirk
;
Van Houdt, Jan
;
Degraeve, Robin
;
Haspeslagh, Luc
;
Groeseneken, Guido
;
Maes, Herman
Journal
Microelectronic Engineering
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1915
since deposited on 2021-09-30
Acq. date: 2025-10-23
Citations
Metrics
Views
1915
since deposited on 2021-09-30
Acq. date: 2025-10-23
Citations