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Single defect studies by means of random telegraph signals in submicron silicon MOSFETs
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Acq. date: 2025-12-11
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Acq. date: 2025-12-11
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1 since deposited on 2021-10-14
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1878 since deposited on 2021-10-14
1last month
Acq. date: 2025-12-11
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