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Radiation-induced dark current increase in CMOS active pixel sensors
Publication:
Radiation-induced dark current increase in CMOS active pixel sensors
Date
2000
Proceedings Paper
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4107.pdf
729.27 KB
Basic data
APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Bogaerts, Jan
;
Dierickx, Bart
;
Van Hoof, Chris
Journal
Abstract
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1945
since deposited on 2021-10-14
Acq. date: 2025-10-23
Citations
Metrics
Views
1945
since deposited on 2021-10-14
Acq. date: 2025-10-23
Citations