Publication:

Radiation-induced dark current increase in CMOS active pixel sensors

Date

2000
Proceedings Paper
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dc.contributor.authorBogaerts, Jan
dc.contributor.authorDierickx, Bart
dc.contributor.authorVan Hoof, Chris
dc.contributor.imecauthorVan Hoof, Chris
dc.date.accessioned2021-10-14T12:41:32Z
dc.date.available2021-10-14T12:41:32Z
dc.date.embargo9999-12-31
dc.date.issued2000
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/4135
dc.source.beginpage105
dc.source.conferencePhotonics for Space Environments VII
dc.source.conferencedate31/07/2000
dc.source.conferencelocationSan Diego, CA USA
dc.source.endpage114
dc.title

Radiation-induced dark current increase in CMOS active pixel sensors

dc.typeProceedings paper
dspace.entity.typePublication
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