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Impact of LER and random dopant fluctuations on FinFET matching performance
Publication:
Impact of LER and random dopant fluctuations on FinFET matching performance
Date
2008
Journal article
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18479.pdf
753.74 KB
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Baravelli, Emanuele
;
Jurczak, Gosia
;
Speciale, N.
;
De Meyer, Kristin
;
Dixit, Abhisek
Journal
IEEE Tr. Nanotechnology
Abstract
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1903
since deposited on 2021-10-17
Acq. date: 2025-10-23
Citations
Metrics
Views
1903
since deposited on 2021-10-17
Acq. date: 2025-10-23
Citations