Skip to content
Institutional repository
Communities & Collections
Browse all items
Scientific publications
Open knowledge
Log In
imec Publications
Conference contributions
Mean free path of electrons in EUV photoresist in the energy range 20 to 450 eV
Publication:
Mean free path of electrons in EUV photoresist in the energy range 20 to 450 eV
Copy permalink
Date
2023
Proceedings Paper
https://doi.org/10.1117/12.2658310
Simple item page
Full metadata
Statistics
Loading...
Loading...
Files
Published version
187.63 KB
Basic data
APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Fallica, Roberto
;
Mahne, Nicola
;
Conard, Thierry
;
Vanleenhove, Anja
;
Nannarone, Stefano
Journal
Proceedings of SPIE
Abstract
Description
Metrics
Downloads
142
since deposited on 2024-04-15
33
last month
6
last week
Acq. date: 2025-12-16
Views
875
since deposited on 2024-04-15
Acq. date: 2025-12-16
Citations
Metrics
Downloads
142
since deposited on 2024-04-15
33
last month
6
last week
Acq. date: 2025-12-16
Views
875
since deposited on 2024-04-15
Acq. date: 2025-12-16
Citations