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Mean free path of electrons in EUV photoresist in the energy range 20 to 450 eV
Publication:
Mean free path of electrons in EUV photoresist in the energy range 20 to 450 eV
Date
2023
Proceedings Paper
https://doi.org/10.1117/12.2658310
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Basic data
APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Fallica, Roberto
;
Mahne, Nicola
;
Conard, Thierry
;
Vanleenhove, Anja
;
Nannarone, Stefano
Journal
Proceedings of SPIE
Abstract
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96
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872
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Acq. date: 2025-10-28
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Metrics
Downloads
96
since deposited on 2024-04-15
9
last week
Acq. date: 2025-10-28
Views
872
since deposited on 2024-04-15
3
last week
Acq. date: 2025-10-28
Citations