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Conference contributions
Mean free path of electrons in EUV photoresist in the energy range 20 to 450 eV
Publication:
Mean free path of electrons in EUV photoresist in the energy range 20 to 450 eV
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Date
2023
Proceedings Paper
https://doi.org/10.1117/12.2658310
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Fallica, Roberto
;
Mahne, Nicola
;
Conard, Thierry
;
Vanleenhove, Anja
;
Nannarone, Stefano
Journal
Proceedings of SPIE
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Downloads
216
since deposited on 2024-04-15
31
last month
6
last week
Acq. date: 2026-02-24
Views
879
since deposited on 2024-04-15
4
last month
Acq. date: 2026-02-24
Citations