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Pattern fidelity verification for logic design in EUV lithography
Publication:
Pattern fidelity verification for logic design in EUV lithography
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Date
2014
Proceedings Paper
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Sugawara, Mino
;
Hendrickx, Eric
;
Philipsen, Vicky
;
Maloney, Chris
;
Fenger, Germain
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1847
since deposited on 2021-10-22
Acq. date: 2025-12-11
Citations
Metrics
Views
1847
since deposited on 2021-10-22
Acq. date: 2025-12-11
Citations