Publication:
Physics based accurate extraction of Leff and Rs for deep submicron MOSFETs
Date
Loading...
Journal
Abstract
Description
Statistics
Views
1917 since deposited on 2021-10-06
2last month
2last week
Acq. date: 2026-10-03
Citations
Statistics
Views
1917 since deposited on 2021-10-06
2last month
2last week
Acq. date: 2026-10-03
Citations