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Physics based accurate extraction of Leff and Rs for deep submicron MOSFETs
Publication:
Physics based accurate extraction of Leff and Rs for deep submicron MOSFETs
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Date
1999
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
De Meyer, Kristin
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Abstract
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1915
since deposited on 2021-10-06
1
last month
Acq. date: 2025-12-15
Citations
Metrics
Views
1915
since deposited on 2021-10-06
1
last month
Acq. date: 2025-12-15
Citations