Publication:
Physics based accurate extraction of Leff and Rs for deep submicron MOSFETs
Date
| dc.contributor.author | De Meyer, Kristin | |
| dc.contributor.imecauthor | De Meyer, Kristin | |
| dc.date.accessioned | 2021-10-06T10:55:53Z | |
| dc.date.available | 2021-10-06T10:55:53Z | |
| dc.date.issued | 1999 | |
| dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/3361 | |
| dc.source.conference | AACD - Advances in Analog Circuit Design; 23-25 March 1999; Opio, France. | |
| dc.title | Physics based accurate extraction of Leff and Rs for deep submicron MOSFETs | |
| dc.type | Oral presentation | |
| dspace.entity.type | Publication | |
| Files | ||
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