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Stress analysis with convergent beam electron diffraction around NMOS transistors
Publication:
Stress analysis with convergent beam electron diffraction around NMOS transistors
Date
2001
Proceedings Paper
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Stuer, Cindy
;
Bender, Hugo
;
Van Landuyt, J.
;
Eyben, Pierre
Journal
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1907
since deposited on 2021-10-14
Acq. date: 2025-10-24
Citations
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Views
1907
since deposited on 2021-10-14
Acq. date: 2025-10-24
Citations