Publication:
Compact thermally stable high voltage FinFET with 40 nm tox and lateral break-down >35 V for 3D NAND flash periphery application
Loading...
Journal
Abstract
Description
Metrics
Views
96 since deposited on 2024-02-20
Acq. date: 2026-01-10
Citations
Metrics
Views
96 since deposited on 2024-02-20
Acq. date: 2026-01-10
Citations