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Back-gate induced noise overshoot in partially-depleted SOI MOSFETs
Publication:
Back-gate induced noise overshoot in partially-depleted SOI MOSFETs
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Date
2005
Proceedings Paper
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Lukyanchikova, N.
;
Garbar, N.
;
Smolanka, A.
;
Simoen, Eddy
;
Claeys, Cor
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2005
since deposited on 2021-10-16
2
last month
Acq. date: 2025-12-11
Citations
Metrics
Views
2005
since deposited on 2021-10-16
2
last month
Acq. date: 2025-12-11
Citations