Publication:

Back-gate induced noise overshoot in partially-depleted SOI MOSFETs

Date

Loading...
Thumbnail Image

Abstract

Description

Metrics

Views

2005 since deposited on 2021-10-16
2last month
Acq. date: 2025-12-11

Citations

Metrics

Views

2005 since deposited on 2021-10-16
2last month
Acq. date: 2025-12-11

Citations