Publication:
Back-gate induced noise overshoot in partially-depleted SOI MOSFETs
Date
| dc.contributor.author | Lukyanchikova, N. | |
| dc.contributor.author | Garbar, N. | |
| dc.contributor.author | Smolanka, A. | |
| dc.contributor.author | Simoen, Eddy | |
| dc.contributor.author | Claeys, Cor | |
| dc.contributor.imecauthor | Simoen, Eddy | |
| dc.contributor.orcidimec | Simoen, Eddy::0000-0002-5218-4046 | |
| dc.date.accessioned | 2021-10-16T03:05:52Z | |
| dc.date.available | 2021-10-16T03:05:52Z | |
| dc.date.issued | 2005 | |
| dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/10812 | |
| dc.source.beginpage | 255 | |
| dc.source.conference | Science and Technology of Semiconductor-on-Insulator Structures and Devices Operating in a Harsh Environment | |
| dc.source.conferencedate | 26/04/2004 | |
| dc.source.conferencelocation | Kiev Ukraine | |
| dc.source.endpage | 260 | |
| dc.title | Back-gate induced noise overshoot in partially-depleted SOI MOSFETs | |
| dc.type | Proceedings paper | |
| dspace.entity.type | Publication | |
| Files | ||
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