Publication:

Generating Test Patterns for Chiplet Interconnects With Optimized Effectiveness and Efficiency

Date

2025-MAR
Journal article
https://doi.org/10.1109/TCAD.2024.3466809
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Author(s)

Chuang, Po-Yao  
;
Lorenzelli, Francesco  
;
Wu, Cheng-Wen
;
Marinissen, Erik Jan  

Journal

IEEE TRANSACTIONS ON COMPUTER-AIDED DESIGN OF INTEGRATED CIRCUITS AND SYSTEMS

Abstract

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181 since deposited on 2025-03-17
Acq. date: 2026-03-17

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181 since deposited on 2025-03-17
Acq. date: 2026-03-17

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