Skip to content
Institutional repository
Communities & Collections
Browse
Site
Log In
imec Publications
Book chapters
Modeling and Characterization of TSV-Induced Noise Coupling
Publication:
Modeling and Characterization of TSV-Induced Noise Coupling
Date
2018
Book Chapter
Simple item page
Full metadata
Statistics
Loading...
Loading...
Basic data
APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Sun, Xiao
;
Rack, Martin
;
Van der Plas, Geert
;
Raskin, Jean-Pierre
;
Beyne, Eric
Journal
Abstract
Description
Metrics
Views
1928
since deposited on 2021-10-26
Acq. date: 2025-10-26
Citations
Metrics
Views
1928
since deposited on 2021-10-26
Acq. date: 2025-10-26
Citations