Publication:
Modeling and Characterization of TSV-Induced Noise Coupling
Date
| dc.contributor.author | Sun, Xiao | |
| dc.contributor.author | Rack, Martin | |
| dc.contributor.author | Van der Plas, Geert | |
| dc.contributor.author | Raskin, Jean-Pierre | |
| dc.contributor.author | Beyne, Eric | |
| dc.contributor.imecauthor | Sun, Xiao | |
| dc.contributor.imecauthor | Van der Plas, Geert | |
| dc.contributor.imecauthor | Beyne, Eric | |
| dc.contributor.orcidimec | Van der Plas, Geert::0000-0002-4975-6672 | |
| dc.contributor.orcidimec | Beyne, Eric::0000-0002-3096-050X | |
| dc.date.accessioned | 2021-10-26T04:59:26Z | |
| dc.date.available | 2021-10-26T04:59:26Z | |
| dc.date.issued | 2018 | |
| dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/31883 | |
| dc.identifier.url | https://www.crcpress.com/Noise-Coupling-in-System-on-Chip/Noulis/p/book/9781498796774 | |
| dc.source.beginpage | Chapter 7 | |
| dc.source.book | Noise Coupling in System-on-Chip | |
| dc.title | Modeling and Characterization of TSV-Induced Noise Coupling | |
| dc.type | Book chapter | |
| dspace.entity.type | Publication | |
| Files | ||
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