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From mean values to distributions of BTI lifetime of deeply scaled FETs through atomistic understanding of the degradation
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From mean values to distributions of BTI lifetime of deeply scaled FETs through atomistic understanding of the degradation
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Date
2011
Proceedings Paper
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Toledano Luque, Maria
;
Kaczer, Ben
;
Franco, Jacopo
;
Roussel, Philippe
;
Grasser, T.
;
Hoffmann, Thomas Y.
;
Groeseneken, Guido
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1949
since deposited on 2021-10-19
Acq. date: 2025-12-11
Citations
Metrics
Views
1949
since deposited on 2021-10-19
Acq. date: 2025-12-11
Citations