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Characterisation of HF-last cleaning of ion-implanted Si surfaces
Publication:
Characterisation of HF-last cleaning of ion-implanted Si surfaces
Date
1998
Journal article
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Kondoh, Eiichi
;
Baklanov, Mikhaïl
;
Jonckx, Franky
;
Maex, Karen
Journal
Materials Science in Semiconductor Processing
Abstract
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1941
since deposited on 2021-09-30
Acq. date: 2025-10-23
Citations
Metrics
Views
1941
since deposited on 2021-09-30
Acq. date: 2025-10-23
Citations