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Hot-carrier analysis on nMOS Si finFETs with solid source doped junctions
Publication:
Hot-carrier analysis on nMOS Si finFETs with solid source doped junctions
Date
2016
Proceedings Paper
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Basic data
APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Vaisman Chasin, Adrian
;
Franco, Jacopo
;
Ritzenthaler, Romain
;
Hellings, Geert
;
Cho, Moon Ju
;
Sasaki, Yuichiro
;
Subirats, Alexandre
;
Roussel, Philippe
;
Kaczer, Ben
;
Linten, Dimitri
;
Horiguchi, Naoto
;
Groeseneken, Guido
;
Thean, Aaron
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1959
since deposited on 2021-10-23
Acq. date: 2025-10-23
Citations
Metrics
Views
1959
since deposited on 2021-10-23
Acq. date: 2025-10-23
Citations