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Advanced characterization of oxide traps: the dynamic time-dependent defect spectroscopy
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Advanced characterization of oxide traps: the dynamic time-dependent defect spectroscopy
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Date
2013
Proceedings Paper
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Grasser, Tibor
;
Rott, K.
;
Reisinger, H.
;
Wagner, P.J.
;
Goes, W
;
Schanovsky, F.
;
Waltl, M.
;
Toledano Luque, Maria
;
Kaczer, Ben
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1934
since deposited on 2021-10-21
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Acq. date: 2025-12-10
Citations
Metrics
Views
1934
since deposited on 2021-10-21
2
last month
1
last week
Acq. date: 2025-12-10
Citations