Publication:
Advanced characterization of oxide traps: the dynamic time-dependent defect spectroscopy
Date
| dc.contributor.author | Grasser, Tibor | |
| dc.contributor.author | Rott, K. | |
| dc.contributor.author | Reisinger, H. | |
| dc.contributor.author | Wagner, P.J. | |
| dc.contributor.author | Goes, W | |
| dc.contributor.author | Schanovsky, F. | |
| dc.contributor.author | Waltl, M. | |
| dc.contributor.author | Toledano Luque, Maria | |
| dc.contributor.author | Kaczer, Ben | |
| dc.contributor.imecauthor | Kaczer, Ben | |
| dc.contributor.orcidimec | Kaczer, Ben::0000-0002-1484-4007 | |
| dc.date.accessioned | 2021-10-21T07:59:44Z | |
| dc.date.available | 2021-10-21T07:59:44Z | |
| dc.date.issued | 2013 | |
| dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/22428 | |
| dc.identifier.url | http://dx.doi.org/10.1109/IRPS.2013.6531957 | |
| dc.source.beginpage | 2D.2 | |
| dc.source.conference | IEEE International Reliability Physics Symposium - IRPS | |
| dc.source.conferencedate | 14/04/2013 | |
| dc.source.conferencelocation | Monterey, CA USA | |
| dc.title | Advanced characterization of oxide traps: the dynamic time-dependent defect spectroscopy | |
| dc.type | Proceedings paper | |
| dspace.entity.type | Publication | |
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