Publication:
Two-dimensional carrier mapping at the nanometer-scale on 32nm node targeted p-MOSFETs using high vacuum scanning spreading resistance microscopy
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1947 since deposited on 2021-10-19
3last month
1last week
Acq. date: 2025-12-15
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Metrics
Views
1947 since deposited on 2021-10-19
3last month
1last week
Acq. date: 2025-12-15
Citations