Publication:
Two-dimensional carrier mapping at the nanometer-scale on 32nm node targeted p-MOSFETs using high vacuum scanning spreading resistance microscopy
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1951 since deposited on 2021-10-19
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Acq. date: 2026-08-04
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Statistics
Views
1951 since deposited on 2021-10-19
2last month
2last week
Acq. date: 2026-08-04
Citations