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Predictive compact model for stress-induced on-product overlay correction
Publication:
Predictive compact model for stress-induced on-product overlay correction
Date
2022
Journal article
https://doi.org/10.1117/1.JMM.21.4.043201
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5.89 MB
Basic data
APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Zhang, Huaichen
;
Tabery, Cyrus
;
Maas, Ruben
;
Khodko, Oleksandr
;
Blanco, Victor
;
Canga, Eren
;
Schleicher, Filip
Journal
JOURNAL OF MICRO-NANOPATTERNING MATERIALS AND METROLOGY-JM3
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37
since deposited on 2023-03-01
Acq. date: 2025-10-23
Views
1454
since deposited on 2023-03-01
Acq. date: 2025-10-23
Citations
Metrics
Downloads
37
since deposited on 2023-03-01
Acq. date: 2025-10-23
Views
1454
since deposited on 2023-03-01
Acq. date: 2025-10-23
Citations