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Conference contributions
Off-state stress degradation mechanism on advanced p-MOSFETs
Publication:
Off-state stress degradation mechanism on advanced p-MOSFETs
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Date
2015-06
Proceedings Paper
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Cho, Moon Ju
;
Spessot, Alessio
;
Kaczer, Ben
;
Aoulaiche, Marc
;
Ritzenthaler, Romain
;
Schram, Tom
;
Fazan, Pierre
;
Horiguchi, Naoto
;
Linten, Dimitri
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1851
since deposited on 2021-10-22
Acq. date: 2025-12-15
Citations
Metrics
Views
1851
since deposited on 2021-10-22
Acq. date: 2025-12-15
Citations