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Accurate RF electrical characterisation of CSPs using MCM-D thin film technology
Publication:
Accurate RF electrical characterisation of CSPs using MCM-D thin film technology
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Date
2004
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Chandrasekhar, Arun
;
Beyne, Eric
;
De Raedt, Walter
;
Nauwelaers, Bart
Journal
IEEE Trans. Advanced Packaging
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1871
since deposited on 2021-10-15
Acq. date: 2025-12-10
Citations
Metrics
Views
1871
since deposited on 2021-10-15
Acq. date: 2025-12-10
Citations