Publication:
Accurate RF electrical characterisation of CSPs using MCM-D thin film technology
Date
| dc.contributor.author | Chandrasekhar, Arun | |
| dc.contributor.author | Beyne, Eric | |
| dc.contributor.author | De Raedt, Walter | |
| dc.contributor.author | Nauwelaers, Bart | |
| dc.contributor.imecauthor | Beyne, Eric | |
| dc.contributor.imecauthor | De Raedt, Walter | |
| dc.contributor.imecauthor | Nauwelaers, Bart | |
| dc.contributor.orcidimec | Beyne, Eric::0000-0002-3096-050X | |
| dc.contributor.orcidimec | De Raedt, Walter::0000-0002-7117-7976 | |
| dc.date.accessioned | 2021-10-15T12:50:47Z | |
| dc.date.available | 2021-10-15T12:50:47Z | |
| dc.date.issued | 2004 | |
| dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/8669 | |
| dc.source.beginpage | 203 | |
| dc.source.endpage | 212 | |
| dc.source.issue | 1 | |
| dc.source.journal | IEEE Trans. Advanced Packaging | |
| dc.source.volume | 27 | |
| dc.title | Accurate RF electrical characterisation of CSPs using MCM-D thin film technology | |
| dc.type | Journal article | |
| dspace.entity.type | Publication | |
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