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A comparative X-ray photoelectron spectroscopy and medium-energy ion-scattering study of ultra-thin, Hf-based high-k films
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1961 since deposited on 2021-10-18
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Acq. date: 2025-10-25
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Views
1961 since deposited on 2021-10-18
418item.page.metrics.field.last-week
Acq. date: 2025-10-25
Citations