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Impact of cryogenic temperature operation on static and low frequency noise behaviors of FD UTBOX nMOSFETs
Publication:
Impact of cryogenic temperature operation on static and low frequency noise behaviors of FD UTBOX nMOSFETs
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Date
2017
Proceedings Paper
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39619.pdf
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Nafaa, B.
;
Cretu, B.
;
Ismail, N.
;
Touayar, O.
;
Simoen, Eddy
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1848
since deposited on 2021-10-24
Acq. date: 2025-12-10
Citations
Metrics
Views
1848
since deposited on 2021-10-24
Acq. date: 2025-12-10
Citations