Publication:

Impact of cryogenic temperature operation on static and low frequency noise behaviors of FD UTBOX nMOSFETs

Date

2017
Proceedings Paper
Simple item page Full metadata Statistics
 
dc.contributor.authorNafaa, B.
dc.contributor.authorCretu, B.
dc.contributor.authorIsmail, N.
dc.contributor.authorTouayar, O.
dc.contributor.authorSimoen, Eddy
dc.contributor.imecauthorSimoen, Eddy
dc.contributor.orcidimecSimoen, Eddy::0000-0002-5218-4046
dc.date.accessioned2021-10-24T09:55:47Z
dc.date.available2021-10-24T09:55:47Z
dc.date.embargo9999-12-31
dc.date.issued2017
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/29055
dc.identifier.urlhttps://ieeexplore.ieee.org/document/7962610/
dc.source.beginpage95
dc.source.conferenceJoint International EUSOSOI Workshop and International Conference on Ultimate Integration on Silicon (EUROSOI-ULIS)
dc.source.conferencedate3/04/2017
dc.source.conferencelocationAthens Greece
dc.source.endpage98
dc.title

Impact of cryogenic temperature operation on static and low frequency noise behaviors of FD UTBOX nMOSFETs

dc.typeProceedings paper
dspace.entity.typePublication
Files

Original bundle

Name:
39619.pdf
Size:
3.8 MB
Format:
Adobe Portable Document Format
Download
Publication available in collections:
Conference contributions