Publication:
60 MeV proton irradiation effects on NO-annealed and standard-oxide deep submicron MOSFETs
Date
| dc.contributor.author | Simoen, Eddy | |
| dc.contributor.author | Hermans, Jan | |
| dc.contributor.author | Vereecken, Wim | |
| dc.contributor.author | Vermoere, Carl | |
| dc.contributor.author | Claeys, C. | |
| dc.contributor.author | Augendre, Emmanuel | |
| dc.contributor.author | Badenes, Gonçal | |
| dc.contributor.author | Mohammadzadeh, A. | |
| dc.contributor.imecauthor | Simoen, Eddy | |
| dc.contributor.imecauthor | Hermans, Jan | |
| dc.contributor.orcidimec | Simoen, Eddy::0000-0002-5218-4046 | |
| dc.contributor.orcidimec | Hermans, Jan::0000-0003-1249-8902 | |
| dc.date.accessioned | 2021-10-14T17:51:17Z | |
| dc.date.available | 2021-10-14T17:51:17Z | |
| dc.date.issued | 2001 | |
| dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/5664 | |
| dc.source.conference | RADECS; 10-14 September 2001; Grenoble, France. | |
| dc.source.conferencelocation | ||
| dc.title | 60 MeV proton irradiation effects on NO-annealed and standard-oxide deep submicron MOSFETs | |
| dc.type | Oral presentation | |
| dspace.entity.type | Publication | |
| Files | ||
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