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Optimizing the read-out bias for the capacitorless 1T bulk FinFET RAM cell
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Optimizing the read-out bias for the capacitorless 1T bulk FinFET RAM cell
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Date
2009
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Collaert, Nadine
;
Aoulaiche, Marc
;
Rakowski, Michal
;
Redolfi, Augusto
;
De Wachter, Bart
;
Van Houdt, Jan
;
Jurczak, Gosia
Journal
IEEE Electron Device Letters
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1885
since deposited on 2021-10-17
Acq. date: 2025-12-16
Citations
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Views
1885
since deposited on 2021-10-17
Acq. date: 2025-12-16
Citations