Publication:
A new technique to extract the oxide charge density at front and back interfaces of SOI NMOSFETs devices
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1927 since deposited on 2021-10-14
1last month
Acq. date: 2026-05-16
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Statistics
Views
1927 since deposited on 2021-10-14
1last month
Acq. date: 2026-05-16
Citations