Publication:
A new technique to extract the oxide charge density at front and back interfaces of SOI NMOSFETs devices
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1921 since deposited on 2021-10-14
2last month
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Acq. date: 2026-01-08
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Views
1921 since deposited on 2021-10-14
2last month
1last week
Acq. date: 2026-01-08
Citations