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Articles
Inline edge illumination X-ray phase contrast imaging through mask misalignment
Publication:
Inline edge illumination X-ray phase contrast imaging through mask misalignment
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Date
2024
Journal article
https://doi.org/10.1364/OE.525730
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Francken, Nicholas
;
Sanctorum, Jonathan
;
Sanctorum, Joaquim
;
Vanthienen, Pieter-Jan
;
Sijbers, Jan
;
De Beenhouwer, Jan
Journal
OPTICS EXPRESS
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Downloads
81
since deposited on 2024-09-10
6
last month
Acq. date: 2025-12-15
Views
539
since deposited on 2024-09-10
1
last month
Acq. date: 2025-12-15
Citations