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Inline edge illumination X-ray phase contrast imaging through mask misalignment
Publication:
Inline edge illumination X-ray phase contrast imaging through mask misalignment
Date
2024
Journal article
https://doi.org/10.1364/OE.525730
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Basic data
APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Francken, Nicholas
;
Sanctorum, Jonathan
;
Sanctorum, Joaquim
;
Vanthienen, Pieter-Jan
;
Sijbers, Jan
;
De Beenhouwer, Jan
Journal
OPTICS EXPRESS
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63
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531
since deposited on 2024-09-10
1
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Acq. date: 2025-10-29
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Metrics
Downloads
63
since deposited on 2024-09-10
4
last week
Acq. date: 2025-10-29
Views
531
since deposited on 2024-09-10
1
last week
Acq. date: 2025-10-29
Citations