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Inline edge illumination X-ray phase contrast imaging through mask misalignment

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dc.contributor.authorFrancken, Nicholas
dc.contributor.authorSanctorum, Jonathan
dc.contributor.authorSanctorum, Joaquim
dc.contributor.authorVanthienen, Pieter-Jan
dc.contributor.authorSijbers, Jan
dc.contributor.authorDe Beenhouwer, Jan
dc.contributor.imecauthorFrancken, Nicholas
dc.contributor.imecauthorSanctorum, Jonathan
dc.contributor.imecauthorVanthienen, Pieter-Jan
dc.contributor.imecauthorSijbers, Jan
dc.contributor.imecauthorSanctorum, Joaquim
dc.contributor.imecauthorDe Beenhouwer, Jan
dc.contributor.orcidimecFrancken, Nicholas::0000-0001-6256-9356
dc.contributor.orcidimecSanctorum, Jonathan::0000-0001-7968-4705
dc.contributor.orcidimecVanthienen, Pieter-Jan::0000-0002-0394-8425
dc.contributor.orcidimecSijbers, Jan::0000-0003-4225-2487
dc.contributor.orcidimecSanctorum, Joaquim::0000-0002-9753-031X
dc.contributor.orcidimecDe Beenhouwer, Jan::0000-0001-5253-1274
dc.date.accessioned2024-11-06T08:44:36Z
dc.date.available2024-09-10T17:34:04Z
dc.date.available2024-11-06T08:44:36Z
dc.date.embargo2024-03-05
dc.date.issued2024
dc.description.wosFundingTextFonds Wetenschappelijk Onderzoek (FoodPhase (S003421N), G090020N, G094320N).
dc.identifier.doi10.1364/OE.525730
dc.identifier.issn1094-4087
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/44457
dc.publisherOptica Publishing Group
dc.source.beginpage10005
dc.source.endpage10021
dc.source.issue18
dc.source.journalOPTICS EXPRESS
dc.source.numberofpages14
dc.source.volume32
dc.title

Inline edge illumination X-ray phase contrast imaging through mask misalignment

dc.typeJournal article
dspace.entity.typePublication
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