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Integration of high-K gate dielectrics - wet etch, cleaning and surface conditioning
Publication:
Integration of high-K gate dielectrics - wet etch, cleaning and surface conditioning
Date
2004
Proceedings Paper
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Basic data
APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
De Gendt, Stefan
;
Beckx, Stephan
;
Caymax, Matty
;
Claes, Martine
;
Conard, Thierry
;
Delabie, Annelies
;
Deweerd, Wim
;
Hellin, David
;
Kraus, Harald
;
Onsia, Bart
;
Paraschiv, Vasile
;
Puurunen, Riikka
;
Rohr, Erika
;
Snow, Jim
;
Tsai, Wilman
;
Van Doorne, Patrick
;
Van Elshocht, Sven
;
Vertommen, Johan
;
Witters, Thomas
;
Heyns, Marc
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Abstract
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2046
since deposited on 2021-10-15
Acq. date: 2025-10-23
Citations
Metrics
Views
2046
since deposited on 2021-10-15
Acq. date: 2025-10-23
Citations