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Nano-scale feature analysis: Achieving high effective lateral resolution with micro-scale material characterization techniques: application to back-end processing
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Nano-scale feature analysis: Achieving high effective lateral resolution with micro-scale material characterization techniques: application to back-end processing
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Date
2015
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Conard, Thierry
;
Franquet, Alexis
;
Vandervorst, Wilfried
Journal
Physica Status Solidi A
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1886
since deposited on 2021-10-22
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Acq. date: 2025-12-15
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Metrics
Views
1886
since deposited on 2021-10-22
1
last month
Acq. date: 2025-12-15
Citations