Publication:

Characteristics of deep submicron n-MOSFETs in the temperature range 4.2 - 300 K

Date

1998

Meeting abstract

Simple item page Full metadata Statistics

Files

2406.pdf 80.83 KB

Author(s)

;

;

Biesemans, Serge

;

De Meyer, Kristin

;

Statistics

1878 since deposited on 2021-09-30

Acq. date: 2026-02-24