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Stacked-etch induced charge loss in hybrid floating gate cells using high- $j inter-gate dielectric
Publication:
Stacked-etch induced charge loss in hybrid floating gate cells using high- $j inter-gate dielectric
Date
2014
Proceedings Paper
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28235.pdf
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Zahid, Mohammed
;
Breuil, Laurent
;
Degraeve, Robin
;
Blomme, Pieter
;
Tan, Chi Lim
;
Lisoni, Judit
;
Van den Bosch, Geert
;
Van Houdt, Jan
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1852
since deposited on 2021-10-22
Acq. date: 2025-10-22
Citations
Metrics
Views
1852
since deposited on 2021-10-22
Acq. date: 2025-10-22
Citations