Publication:

Stacked-etch induced charge loss in hybrid floating gate cells using high- $j inter-gate dielectric

Date

2014
Proceedings Paper
Simple item page Full metadata Statistics
 
dc.contributor.authorZahid, Mohammed
dc.contributor.authorBreuil, Laurent
dc.contributor.authorDegraeve, Robin
dc.contributor.authorBlomme, Pieter
dc.contributor.authorTan, Chi Lim
dc.contributor.authorLisoni, Judit
dc.contributor.authorVan den Bosch, Geert
dc.contributor.authorVan Houdt, Jan
dc.contributor.imecauthorBreuil, Laurent
dc.contributor.imecauthorDegraeve, Robin
dc.contributor.imecauthorBlomme, Pieter
dc.contributor.imecauthorVan den Bosch, Geert
dc.contributor.imecauthorVan Houdt, Jan
dc.contributor.orcidimecBreuil, Laurent::0000-0003-2869-1651
dc.contributor.orcidimecVan den Bosch, Geert::0000-0001-9971-6954
dc.contributor.orcidimecVan Houdt, Jan::0000-0003-1381-6925
dc.date.accessioned2021-10-22T08:49:18Z
dc.date.available2021-10-22T08:49:18Z
dc.date.embargo9999-12-31
dc.date.issued2014
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/24875
dc.identifier.urlhttp://ieeexplore.ieee.org/xpl/articleDetails.jsp?tp=&arnumber=6861156&contentType=Conference+Publications
dc.source.beginpageMY-1.1
dc.source.conferenceInternational Reliability Physics Symposium - IRPS
dc.source.conferencedate1/06/2014
dc.source.conferencelocationWaikoloa, HI USA
dc.source.endpageMY-1.5
dc.title

Stacked-etch induced charge loss in hybrid floating gate cells using high- $j inter-gate dielectric

dc.typeProceedings paper
dspace.entity.typePublication
Files

Original bundle

Name:
28235.pdf
Size:
458.77 KB
Format:
Adobe Portable Document Format
Download
Publication available in collections:
Conference contributions