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AFM-based tomography for probing the electrical properties in confined volumes at the nanometer scale
Publication:
AFM-based tomography for probing the electrical properties in confined volumes at the nanometer scale
Date
2013
Meeting abstract
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Schulze, Andreas
;
Hantschel, Thomas
;
Eyben, Pierre
;
Verhulst, Anne
;
Rooyackers, Rita
;
Vandooren, Anne
;
Mody, Jay
;
Vandervorst, Wilfried
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Abstract
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1949
since deposited on 2021-10-21
Acq. date: 2025-10-23
Citations
Metrics
Views
1949
since deposited on 2021-10-21
Acq. date: 2025-10-23
Citations