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Electron valence-band tunnelling excess noise in twin-gate silicon-on-insulator MOSFETs
Publication:
Electron valence-band tunnelling excess noise in twin-gate silicon-on-insulator MOSFETs
Date
2005
Proceedings Paper
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Simoen, Eddy
;
Claeys, Cor
;
Lukyanchikova, N.
;
Gabar, N.
;
Smolanka, A.
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Abstract
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1945
since deposited on 2021-10-16
Acq. date: 2025-10-24
Citations
Metrics
Views
1945
since deposited on 2021-10-16
Acq. date: 2025-10-24
Citations