Publication:
Electron valence-band tunnelling excess noise in twin-gate silicon-on-insulator MOSFETs
Date
| dc.contributor.author | Simoen, Eddy | |
| dc.contributor.author | Claeys, Cor | |
| dc.contributor.author | Lukyanchikova, N. | |
| dc.contributor.author | Gabar, N. | |
| dc.contributor.author | Smolanka, A. | |
| dc.contributor.imecauthor | Simoen, Eddy | |
| dc.contributor.orcidimec | Simoen, Eddy::0000-0002-5218-4046 | |
| dc.date.accessioned | 2021-10-16T05:03:48Z | |
| dc.date.available | 2021-10-16T05:03:48Z | |
| dc.date.issued | 2005 | |
| dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/11205 | |
| dc.source.beginpage | 113 | |
| dc.source.conference | Proceedings of ULIS | |
| dc.source.conferencedate | 7/04/2005 | |
| dc.source.conferencelocation | Bologna Italy | |
| dc.source.endpage | 116 | |
| dc.title | Electron valence-band tunnelling excess noise in twin-gate silicon-on-insulator MOSFETs | |
| dc.type | Proceedings paper | |
| dspace.entity.type | Publication | |
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