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Determining weak Fermi-level pinning in MOS devices by coductance and capacitance analysis and application to GaAs MOS devices
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Determining weak Fermi-level pinning in MOS devices by coductance and capacitance analysis and application to GaAs MOS devices
Date
2007
Journal article
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14621.pdf
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Basic data
APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Martens, Koen
;
Wang, Wenfei
;
dimoulas, A.
;
Borghs, Gustaaf
;
Meuris, Marc
;
Groeseneken, Guido
;
Maes, Herman
Journal
Solid-State Electronics
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1890
since deposited on 2021-10-16
Acq. date: 2025-10-23
Citations
Metrics
Views
1890
since deposited on 2021-10-16
Acq. date: 2025-10-23
Citations