Publication:

Determining weak Fermi-level pinning in MOS devices by coductance and capacitance analysis and application to GaAs MOS devices

Date

2007
Journal article
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dc.contributor.authorMartens, Koen
dc.contributor.authorWang, Wenfei
dc.contributor.authordimoulas, A.
dc.contributor.authorBorghs, Gustaaf
dc.contributor.authorMeuris, Marc
dc.contributor.authorGroeseneken, Guido
dc.contributor.authorMaes, Herman
dc.contributor.imecauthorMartens, Koen
dc.contributor.imecauthorWang, Wenfei
dc.contributor.imecauthorBorghs, Gustaaf
dc.contributor.imecauthorMeuris, Marc
dc.contributor.imecauthorGroeseneken, Guido
dc.contributor.orcidimecMartens, Koen::0000-0001-7135-5536
dc.contributor.orcidimecMeuris, Marc::0000-0002-9580-6810
dc.date.accessioned2021-10-16T17:52:20Z
dc.date.available2021-10-16T17:52:20Z
dc.date.embargo9999-12-31
dc.date.issued2007
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/12561
dc.source.beginpage1101
dc.source.endpage1108
dc.source.issue8
dc.source.journalSolid-State Electronics
dc.source.volume51
dc.title

Determining weak Fermi-level pinning in MOS devices by coductance and capacitance analysis and application to GaAs MOS devices

dc.typeJournal article
dspace.entity.typePublication
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