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Extraction of the defect distributions in DRAM capacitor using I–V and C–V sensitivity maps
Publication:
Extraction of the defect distributions in DRAM capacitor using I–V and C–V sensitivity maps
Date
2016
Journal article
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Sereni, Gabriele
;
Larcher, Luca
;
Kaczer, Ben
;
Popovici, Mihaela Ioana
Journal
IEEE Electron Device Letters
Abstract
Description
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1949
since deposited on 2021-10-23
Acq. date: 2025-10-23
Citations
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Views
1949
since deposited on 2021-10-23
Acq. date: 2025-10-23
Citations