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Differential variable base charge pumping (Delta-CP) for SiO2/SiC interface characterization
Publication:
Differential variable base charge pumping (Delta-CP) for SiO2/SiC interface characterization
Date
2019
Proceedings Paper
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45521.pdf
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Basic data
APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Moens, P.
;
Constant, A.
;
Stockman, Arno
;
Franchi, J.
;
Allerstam, F.
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Abstract
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1941
since deposited on 2021-10-27
Acq. date: 2025-10-25
Citations
Metrics
Views
1941
since deposited on 2021-10-27
Acq. date: 2025-10-25
Citations